The main purpose of the report to analyze electrical characterization techniques dedicated to the understanding of dielectric behavior. The scope of the report is to introduce several characterization techniques used for measuring and analyzing the types of leakage current mechanisms and breakdown mechanisms that occur. Dielectric measurement techniques are also introduced briefly.
Dielectrics are insulators that undergo polarization in the presence of an electric field. Polarization processes include: electrical, ionic and dipole polarization. Due to the ability to get polarized, dielectrics have many uses, including increasing the capacitance of a capacitor.
Several leakage mechanisms are analyzed in this report including the Fowler-Nordheim, Hopping, Schottky, Poole-Frenkel, and space charge driven mechanism. Where analysis of these mechanisms is achieved utilizing the mentioned characterization techniques: TSDC, I-t, I-V, C-V, and FBT techniques. Dielectric measurement techniques are also mentioned in the body of the report, which include: transmission/reflection line, open-ended coaxial probe, and the free space method. One main conclusion made here was that the free-space method has advantages over the other methods as it allows for reflection and transmission measurements without physical contact wit the sample.
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